Tabletop SEM
Model: SNE-4500M
Manufacturers: SEC – Korea
Scanning Electron Microscopy (SEM) is used for various ingredient analysis and surface structure analysis through several detectors after focusing and detecting secondary electron emitted from sample by shooting electron beam on the sample in the chamber. SEM is the foundation technique of MEMS (Microelectromechanical systems) industry and an equipment for analysis and measurement of ultrafine nano structure having resolution of 1nm.
Features:
SNE-4500M with various detectors SE and high vacuum.
SNE-4500M has magnification of Maximum 100,000x.
SE (Secondary Eletron)
Creat images with the height level informaiton. Mostly used for surface inspection.
The only Table-top SEM of which has 5-axis, enables simple and easy operation with unlimited movement of stage and mouse control system.
Able to get various analysis results with various scan modes measurement tool
Specifications:
|
Resolution |
5 nm (30kV, SE Image) |
|
Magnification |
20x – 100.000x |
|
Accelerating Voltage |
1 – 30kV (1/5/10/15/20/30) |
|
Detector |
Secondary Electron Image (SE) |
|
Electron Gun |
Pre-centered Tungsten Filament Cartridge |
|
Stage Traverse |
X: 40mm, Y: 40mm, R: 360o Z: 0 to 35mm, T: 0o to 45o |
|
Max. Sample size |
80 mm in Diameter x 35 mm in Height |
|
Automation Function |
Auto Start, Auto Focus, Auto Stigmator, Auto Contrast & Brightness |
|
Image Format |
BMP, JPEG, PNG, TIFF |
|
Vacuum Mode |
High Vacuum (Low Vacuum Option) |
|
Vacuum Pump |
Rotary Pump/ Turbo Molecular Pump (Full Automation) |
|
Dimensions |
Main Unit: 390(W)x380(D)x560(H)mm, 88kg Controller unit: 390(W)x325(D)x560(H)mm, 37kg Rotary Pump: 400(W)x160(D)x340(H)mm, 24kg |
Application:
